Le laboratoire > Moyens > Moyens expérimentaux et numériques > Topographic observation and physico-chemical characterization
par
- 3 mai 2012
Scanning electron microscope + EDX (in charge : Gérard MEILLE)
EFTEM LEO (in charge : Béatrice VACHER)
Optical microscopes and binocular (in charge : Gérard MEILLE)
AFM 1 (in charge : Jean-Luc LOUBET)
AFM 2 (electrical measures) (in charge : Christelle GUERRET / Jean-Luc LOUBET)
WYCO interferometer (in charge : Hassan ZAHOUANI)
WYCO NT9300 interferometer (in charge :Siegfried FOUVRY)
Confocal roughness meter (in charge : Hassan ZAHOUANI)
Fringe projection roughness meter (in charge : Hassan ZAHOUANI)
Tactile roughness meter (in charge : Hassan ZAHOUANI)
X-ray diffraction under grazing incidence and reflection tool (in charge : Bernard BEAUGIRAUD)
Infrared spectrometer by Fourier transform (in charge : Bernard BEAUGIRAUD)
PHILIPS XL 20 scanning electron microscope (in charge : Bernard BEAUGIRAUD)
Residual stress measurement tool through X-ray diffraction (in charge : Stéphane VALETTE)
Space charge electron microscope (in charge : Denyse JUVE)
Taylor Hobson talysurf 10 2D profilometer (in charge : Michel DURSAPT )
Somicronic S2 3D surface state measurer (in charge : Michel DURSAPT)
Eclipse L 150 interferometric microsope (in charge : Michel DURSAPT)
Magnifying binocular with numeric image analysis (in charge : Joël RECH)
MAHR 2D roughness meter (in charge : Joël RECH)